X-ray diffraction is a non-destructive method to characterize materials. This technique used by many labs makes it possible to: i) determine in about 10 minutes the purity of a sample, ii) quantify (% by weight) the several existing phases and iii) solve the “crystallographic structure” of new components, in other words determine the atomic three-dimensional arrangement in crystalized matter.
Two XDR main techniques are available at the platform. The first one (the historical method) is the diffraction on monocrystals. The current devices can analyse crystals up to 20-µm length (that about 2 to 5 times smaller than the diameter of a strand of hair). The second technique is the diffraction on powder. Often used, we can with this method determine the purity of a sample, calculate the particle size and solve the crystallographic structure.
Equipment and human resources
> Funded by the RS2E
Diffractometer on monocrystals, Brucker Venture (see the picture above), equipped with a molybdenum microsource, a 2D PHOTON 100 detector and a low (80K) and high (550K) temperature blowgun.
> Other funds
1 diffractometer Bruker D8 Advance equipped with a copper anticathode and a cryo-oven (180K- 450K) working under controlled atmosphere.
1 diffractometer Bruker D8 Advance equipped with a cobalt anticathode and a high temperature oven (up to 1200K) working under controlled atmosphere.
1 diffractometer Bruker D4 Endeavor equipped with a copper anticathode and a store that can contain up to 48 samples for routine measurements.
The LRCS has also developed electrochemical cells that make it possible to acquire simultaneously diffractograms and electrochemical data (galvanostatic curbs).
> Human resources
- 1 lecturer (Jean-Noël Chotard)
- 1 professor of university (Christian Masquelier)
- 1 IR (Jean-Bernard Leriche) for the development of new sample holders